{"id":203637,"date":"2013-02-04T14:04:08","date_gmt":"2013-02-04T14:04:08","guid":{"rendered":"http:\/\/d45h139.public.uconn.edu\/sites\/news\/?p=14487"},"modified":"2025-01-29T16:30:50","modified_gmt":"2025-01-29T21:30:50","slug":"conference-on-counterfeit-electronics-addresses-growing-national-concern-2","status":"publish","type":"post","link":"https:\/\/today.uconn.edu\/2013\/02\/conference-on-counterfeit-electronics-addresses-growing-national-concern-2\/","title":{"rendered":"Conference on Counterfeit Electronics Addresses Growing National Concern"},"content":{"rendered":"<p><em>By Colin Poitras, UConn Today<\/em><\/p>\n<p>Some of the nation\u2019s top experts in computer hardware security gathered in Storrs\u00a0last week to discuss new ways to thwart a growing international counterfeit electronics <a href=\"http:\/\/d45h139.public.uconn.edu\/sites\/news\/wp-content\/uploads\/chase1a.jpg\"><img decoding=\"async\" class=\"alignright  wp-image-14514 img-responsive lazyload\" alt=\"chase1a\" data-src=\"http:\/\/d45h139.public.uconn.edu\/sites\/news\/wp-content\/uploads\/chase1a.jpg\" width=\"186\" height=\"163\" src=\"data:image\/svg+xml;base64,PHN2ZyB3aWR0aD0iMSIgaGVpZ2h0PSIxIiB4bWxucz0iaHR0cDovL3d3dy53My5vcmcvMjAwMC9zdmciPjwvc3ZnPg==\" style=\"--smush-placeholder-width: 186px; --smush-placeholder-aspect-ratio: 186\/163;\" \/><\/a>industry.<\/p>\n<p>Reports are increasing of recycled and cloned computer chips making their way into the electronic component supply chain that threaten the integrity of everything from cell phones and personal computers to medical devices and the weapon systems of military fighter jets.<\/p>\n<p>In a series of workshops on Jan. 28 and 29, engineers from Intel, Texas Instruments, Analog Devices, Honeywell, the Missile Defense Agency (MDA), and Connecticut-based SMT Corp., as well as other entities, discussed new tools for improving detection in the increasingly advanced \u2013 and profitable \u2013 world of counterfeit electronics. They also discussed ways to stay one step ahead of the\u00a0 counterfeiters through the development of low-<a href=\"http:\/\/d45h139.public.uconn.edu\/sites\/news\/wp-content\/uploads\/chase1b.jpg\"><img decoding=\"async\" class=\"alignleft  wp-image-14565 img-responsive lazyload\" alt=\"chase1b\" data-src=\"http:\/\/d45h139.public.uconn.edu\/sites\/news\/wp-content\/uploads\/chase1b-300x262.jpg\" width=\"240\" height=\"210\" src=\"data:image\/svg+xml;base64,PHN2ZyB3aWR0aD0iMSIgaGVpZ2h0PSIxIiB4bWxucz0iaHR0cDovL3d3dy53My5vcmcvMjAwMC9zdmciPjwvc3ZnPg==\" style=\"--smush-placeholder-width: 240px; --smush-placeholder-aspect-ratio: 240\/210;\" \/><\/a>cost technologies that would stamp unique \u201csignatures\u201d on hardware components to ensure that only reliable, high-quality parts are available to manufacturers.<\/p>\n<p>Read the full story <a href=\"https:\/\/today.uconn.edu\/blog\/2013\/02\/conference-on-counterfeit-electronics-addresses-growing-national-concern\/?utm_source=feedburner&amp;utm_medium=feed&amp;utm_campaign=Feed%3A+uconn-today+%28UConn+Today%29\">here.<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Some of the nation&#8217;s top experts in computer hardware security gathered in Storrs last week to discuss new ways to thwart a growing international counterfeit electronics industry. In a series of workshops on Jan. 28 and 29, engineers from Intel, Texas Instruments, Analog Devices, Honeywell, the Missile Defense Agency (MDA), and Connecticut-based SMT Corp., as well as other entities, discussed new tools for improving detection in the increasingly advanced \u2013 and profitable \u2013 world of counterfeit electronics.<\/p>\n","protected":false},"author":122,"featured_media":224472,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_crdt_document":"","wds_primary_category":0,"wds_primary_series":0,"wds_primary_attribution":0,"footnotes":""},"categories":[1866],"tags":[],"magazine-issues":[],"coauthors":[2110],"class_list":["post-203637","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-engr"],"pp_statuses_selecting_workflow":false,"pp_workflow_action":"current","pp_status_selection":"publish","acf":[],"publishpress_future_action":{"enabled":false,"date":"2026-05-07 18:14:29","action":"change-status","newStatus":"draft","terms":[],"taxonomy":"category","extraData":[]},"publishpress_future_workflow_manual_trigger":{"enabledWorkflows":[]},"_links":{"self":[{"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/posts\/203637","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/users\/122"}],"replies":[{"embeddable":true,"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/comments?post=203637"}],"version-history":[{"count":1,"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/posts\/203637\/revisions"}],"predecessor-version":[{"id":224647,"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/posts\/203637\/revisions\/224647"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/media\/224472"}],"wp:attachment":[{"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/media?parent=203637"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/categories?post=203637"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/tags?post=203637"},{"taxonomy":"magazine-issue","embeddable":true,"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/magazine-issues?post=203637"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/today.uconn.edu\/wp-rest\/wp\/v2\/coauthors?post=203637"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}